General Summary:
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Interface with design team to ensure DFT design rules and
coverages are met.
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Generating high quality manufacturing ATPG test patterns for stuck-at (SAF),
transition fault (TDF) models through the use of on-chip test compression
techniques.
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MBIST verification (including repair), test pattern generation through
Mentor tool.
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ATPG (SAF, TDF) and MBIST verification using unit delay and min/max timing
corner simulations.
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Work with the Product/Test engineering teams on the delivery of
manufacturing test patterns for ATE.
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Responsible for supporting post silicon debug effort, issue resolution.
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Responsible for Diagnostic Tool generation for ATPG, MBIST and bring-up on
ATE.
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Developing, enhancing and maintaining scripts as necessary
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Minimum of 10+ years’ experience in ASIC/DFT – simulation and Silicon
validation
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Detailed knowledge on DFT concepts, pattern simulation, Silicon
debug and yield enhancement
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In depth knowledge and hands-on experience in ATPG - coverage analysis.
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In depth knowledge of Memory verification, repair and failure root-cause
analysis.
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Experience with any of these tools is required
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ATPG - TestKompress
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MBIST - Mentor ETVerify
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Simulation - VCS (preferred), modelsim.
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Expertise in scripting languages such as Perl, shell, etc. is an added
advantage
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Ability to work in an international team, dynamic environment with good
communication skills
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Ability to learn and adapt to new tools, methodologies.
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Ability to do multi-tasking & work on several high priority designs in
parallel.
Minimum Qualifications:
• Bachelor's degree in Computer Science, Engineering, Information Systems, or
related field and 10+ years of Hardware Engineering or related work
experience.
OR
Master's degree in Computer Science, Engineering, Information Systems, or
related field and 9+ years of Hardware Engineering or related work
experience.
OR
PhD in Computer Science, Engineering, Information Systems, or related field
and 8+ years of Hardware Engineering or related work experience.
10+ yrs of experience in DFT/ATPG/BIST